ChatDL: An LLM-Based Defect Localization Approach for Software in IIoT Flexible Manufacturing
Published in IEEE Internet of Things Journal, 2025
This paper introduces a LLM-based method to detect software defects.
Recommended citation: H. Yang, Y. Zhou, T. Liang and L. Kuang, "ChatDL: An LLM-Based Defect Localization Approach for Software in IIoT Flexible Manufacturing," in IEEE Internet of Things Journal, doi: 10.1109/JIOT.2025.3531512.